Using $^{22}$Na and $^{83{\rm m}}$Kr to calibrate and study the properties of scintillation in xenon-doped liquid argon

TL;DR

This study investigates the scintillation properties of xenon-doped liquid argon using $^{22}$Na and $^{83m}$Kr sources, establishing a waveform model and confirming consistent scintillation efficiency across different energies.

Contribution

It introduces a detailed analysis of energy transfer in xenon-doped liquid argon and demonstrates the first use of $^{83m}$Kr as a calibration source in this context.

Findings

Xenon doping affects scintillation time profiles.

Scintillation efficiency remains consistent from 41.5 keV to 511 keV.

Waveform model accurately fits scintillation signals.

Abstract

We have measured the properties of scintillation light in liquid argon doped with xenon concentrations from 165 ppm to 10,010 ppm using a $^{22}$Na source. The energy transfer processes in the xenon-doped liquid argon are discussed in detail, and a new waveform model is established and used to fit the average waveform. The time profile of the scintillation photon in the xenon-doped liquid argon and of the TPB emission are presented. The quantities of xenon-doped are controlled by a Mass Flow Controller which is calibrated via a Redusial Gas Analyzer to ensure that the xenon concentration is accurate. In addition, a successful test of $^{83{\rm m}}$Kr as a calibration source has been implemented in the xenon-doped liquid argon detector for the first time. By comparing the light yield of the $^{22}$Na and $^{83{\rm m}}$Kr, it can be concluded that the scintillation efficiency is almost same over the range of 41.5 keV to 511 keV.