Current distribution in metallic multilayers from resistance measurements

TL;DR

This study investigates how current distributes across multilayer structures using resistance measurements, revealing significant variations and emphasizing the need for detailed structural data for accurate modeling.

Contribution

It introduces a comprehensive analysis of current distribution in metallic multilayers, combining experimental measurements with advanced modeling techniques.

Findings

Current distribution varies significantly with layer thickness.

Structural data critically influences current repartition estimates.

Multiple models reveal different aspects of current flow.

Abstract

The in-plane current profile within multilayers of generic structure Ta/Pt/(CoNi)/Pt/Ta is investigated. A large set of samples where the thickness of each layer is systematically varied was grown, followed by the measurement of the sheet resistance of each sample. The data are analyzed by a series of increasingly elaborate models, from a macroscopic engineering approach to mesoscopic transport theory. Non-negligible variations of the estimated repartition of current between the layers are found. The importance of having additional structural data is highlighted.