Dual-energy X-ray dark-field material decomposition
Thorsten Sellerer, Korbinian Mechlem, Ruizhi Tang, Kirsten Taphorn,, Franz Pfeiffer, Julia Herzen

TL;DR
This paper introduces a novel dual-energy X-ray dark-field imaging technique that enables material-specific microstructure decomposition, potentially enhancing clinical diagnosis by providing detailed information about microstructures below the spatial resolution.
Contribution
It develops a physical model and algorithms for dual-energy dark-field material decomposition, extending traditional attenuation-based methods to dark-field imaging.
Findings
Successful experimental demonstration of microstructure decomposition
Energy-dependent dark-field signals enable material differentiation
Potential for improved clinical microstructure analysis
Abstract
Dual-energy imaging is a clinically well-established technique that offers several advantages over conventional X-ray imaging. By performing measurements with two distinct X-ray spectra, differences in energy-dependent attenuation are exploited to obtain material-specific information. This information is used in various imaging applications to improve clinical diagnosis. In recent years, grating-based X-ray dark-field imaging has received increasing attention in the imaging community. The X-ray dark-field signal originates from ultra small-angle scattering within an object and thus provides information about the microstructure far below the spatial resolution of the imaging system. This property has led to a number of promising future imaging applications that are currently being investigated. However, different microstructures can hardly be distinguished with current X-ray dark-field…
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