High-Fidelity Simultaneous Detection of Trapped Ion Qubit Register

TL;DR

This paper demonstrates high-fidelity detection of multi-qubit trapped ion registers using a novel camera, achieving extremely low detection errors suitable for scalable quantum computing.

Contribution

It introduces a new detection method with a specialized camera enabling high-fidelity, multi-qubit state measurement in trapped ion systems.

Findings

Single qubit detection error of 4.2 ppm

Four-qubit state detection error of 17 ppm

Detection limited by qubit decay lifetime

Abstract

Qubit state detection is an important part of a quantum computation. As number of qubits in a quantum register increases, it is necessary to maintain high fidelity detection to accurately measure the multi-qubit state. Here we present experimental demonstration of high-fidelity detection of a multi-qubit trapped ion register with average single qubit detection error of 4.2(1.5) ppm and a 4-qubit state detection error of 17(2) ppm, limited by the decay lifetime of the qubit, using a novel single-photon-sensitive camera with fast data collection, excellent temporal and spatial resolution, and low instrumental crosstalk.