A novel direct structured-light inspection technique for contaminant and defect detection

TL;DR

This paper introduces a new direct structured-light inspection technique (DSIT) that effectively detects contaminants and defects on specular and transparent surfaces without complex calculations, using reflection and transmission systems.

Contribution

The paper presents a novel inspection method that simplifies defect detection on challenging surfaces by eliminating the need for computational analysis.

Findings

Effective detection of contaminants and defects demonstrated through simulations.

Applicable to both specular and transparent surfaces.

No complex calculations required for defect distribution analysis.

Abstract

The Direct Structured-Light Inspection Technique (DSIT) proposed in this paper is a novel method that can be implemented under two types of binary structured light illumination to detect contaminants and defects on specular surfaces and transparent objects, in which light reflection system is used to detect specular surfaces, while light transmission system is applied for transparent object inspection. Based on this technique, contaminant and defect distribution can be directly obtained without any calculation process. Relevant simulations and experiments are performed to prove the effectiveness of DSIT.