Using photoelectron spectroscopy to measure resonant inelastic X-ray scattering: A computational investigation
Daniel J. Higley, Hirohito Ogasawara, Sioan Zohar, Georgi L., Dakovski

TL;DR
This paper explores a novel computational method called PAX that transforms RIXS measurement into an electron measurement problem, enabling more compact and high-throughput spectroscopy with promising accuracy demonstrated through simulations.
Contribution
It introduces PAX, a new approach that uses photoelectron spectrometry and machine learning to measure RIXS spectra more efficiently and accurately.
Findings
Accurately estimates features with 100s of meV width using 10^5 electrons.
Distinguishes 100 meV FWHM peaks separated by 45 meV with 10^7 electrons.
Demonstrates potential for compact, high-throughput RIXS measurement.
Abstract
Resonant inelastic X-ray scattering (RIXS) has become an important scientific tool. Nonetheless, conventional high-resolution RIXS measurements (<100 meV), especially in the soft x-ray range, require large and low-throughput grating spectrometers that limits measurement accuracy and simplicity. Here, we computationally investigate the performance of a different method for measuring RIXS, Photoelectron Spectrometry for Analysis of X-rays (PAX). This method transforms the X-ray measurement problem of RIXS to an electron measurement problem, enabling use of compact, high-throughput electron spectrometers. In PAX, X-rays to be measured are incident on a converter material and the energy distribution of the resultant photoelectrons, the PAX spectrum, is measured with an electron spectrometer. The incident X-ray spectrum is then estimated through a deconvolution algorithm that leverages…
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Taxonomy
TopicsElectron and X-Ray Spectroscopy Techniques · X-ray Spectroscopy and Fluorescence Analysis · Nuclear Physics and Applications
