Contamination of TEM Holders Quantified and Mitigated with Open-Hardware, High-Vacuum Bakeout System
Yin Min Goh, Jonathan Schwartz, Emily Rennich, Tao Ma, Bobby Kerns,, Robert Hovden

TL;DR
This paper introduces an open-hardware high-vacuum system for TEM holders that significantly reduces hydrocarbon contamination and improves vacuum conditions, enhancing high-resolution electron microscopy.
Contribution
The authors present a novel open-source high-vacuum manifold with bakeout capabilities for TEM holders, effectively reducing contaminants and enabling cleaner, more reliable microscopy experiments.
Findings
Overnight storage reduces contaminants by 10-100 times.
Bakeout lowers contaminant pressure below 10^-10 Torr.
Bakeout of loaded TEM holders is the most effective cleaning method.
Abstract
Hydrocarbon contamination plagues high-resolution and analytical electron microscopy by depositing carbonaceous layers onto surfaces during electron irradiation, which can render carefully prepared specimens useless. Increased specimen thickness degrades resolution with beam broadening alongside loss of contrast. The large inelastic cross-section of carbon hampers accurate atomic species detection. Oxygen and water molecules pose problems of lattice damage by chemically etching the specimen during imaging. These constraints on high-resolution and spectroscopic imaging demand clean, high-vacuum microscopes with dry pumps. Here, we present an open-hardware design of a high-vacuum manifold for transmission electron microscopy (TEM) holders to mitigate hydrocarbon and residual species exposure. We quantitatively show that TEM holders are inherently dirty and introduce a range of unwanted…
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