A system to test 2D optoelectronic devices in high vacuum

TL;DR

This paper introduces a cost-effective, high-vacuum testing system for 2D optoelectronic devices, enabling comprehensive characterization across various wavelengths and temperatures, overcoming limitations of conventional systems.

Contribution

The authors develop a simple, affordable high-vacuum setup using standard components, facilitating advanced optoelectronic device testing for 2D materials.

Findings

System enables testing in broad wavelength range

Allows temperature modulation from room temperature to 150°C

Demonstrates effective characterization of 2D optoelectronic devices

Abstract

The exploration of electronic and optoelectronic properties of two-dimensional (2D) materials has become one of the most attractive line of research since the isolation of graphene. Such 'all-surface materials' present a strong sensitivity to environmental conditions and thus characterization of the devices based on these materials usually requires measurement systems operating in high-vacuum. However, conventional optoelectronic probe-station testing systems are are not compatible with high vacuum operation and vacuum-compatible versions are rather expensive. Here, we present a high-vacuum system specifically designed to test electronic and optoelectronic devices based on 2D materials. This system can be implemented with low budget and it is mostly based on the assembly of commercially available standard vacuum and optic components. Despite the simplicity of this system we demonstrate full capabilities to characterize optoelectronic devices in a broad range of wavelengths with fast pumping/venting speed and possibility of modulating the device temperature (room temperature to ~150deg).