Membrane-based scanning force microscopy

TL;DR

This paper introduces a novel membrane-based scanning force microscope that uses an inverted geometry with a vibrating substrate and a stationary tip, achieving high force sensitivity for imaging samples.

Contribution

The development of a membrane-based SFM with inverted geometry and demonstration of its high force sensitivity and imaging capabilities.

Findings

Successful imaging of sample topography on membrane surface

Membrane retains force sensitivity with samples and tip loaded

Potential for quantum-limited force sensing and imaging

Abstract

We report the development of a scanning force microscope based on an ultra-sensitive silicon nitride membrane transducer. Our development is made possible by inverting the standard microscope geometry - in our instrument, the substrate is vibrating and the scanning tip is at rest. We present first topography images of samples placed on the membrane surface. Our measurements demonstrate that the membrane retains an excellent force sensitivity when loaded with samples and in the presence of a scanning tip. We discuss the prospects and limitations of our instrument as a quantum-limited force sensor and imaging tool.