Positive versus negative resistance response to hydrogenation in palladium and its alloys
Sudhansu Sekhar Das, Gregory Kopnov, Alexander Gerber

TL;DR
This paper investigates how hydrogen absorption causes thickness expansion in palladium-based thin films, significantly affecting their resistance response, and develops a model that explains both positive and negative resistance changes across various Pd systems.
Contribution
It introduces a thickness-expansion model to explain hydrogenation resistance responses in palladium films, validated across multiple Pd-based materials with different structures and resistivities.
Findings
Thickness expansion influences resistance response polarity.
The model explains both positive and negative resistance changes.
Validation across different Pd systems confirms model robustness.
Abstract
Resistive solid state sensors are widely used in multiple applications, including molecular and gas detection. Absorption or intercalation of the target species varies the lattice parameters and an effective thickness of thin films, which is usually neglected in analyzing their transport properties in general and the sensor response in particular. Here, we explore the case of palladium-based thin films absorbing hydrogen and demonstrate that expansion of thickness is an important mechanism determining the magnitude and the very polarity of the resistance response to hydrogenation in high resistivity films. The model of the resistance response that takes into account modifications of thickness was tested and confirmed in three Pd-based systems with variable resistivity: thin Pd films above and below the percolation threshold, thick Pd-SiO2 granular composite films with different content…
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Taxonomy
TopicsAdvanced Materials Characterization Techniques · Hydrogen embrittlement and corrosion behaviors in metals · Metallurgical and Alloy Processes
