Development of a Neutron Imaging Sensor using INTPIX4-SOI Pixelated Silicon Devices
Y. Kamiya, T. Miyoshi, H. Iwase, T. Inada, A. Mizushima, and Y. Mita, K. Shimazoe, H. Tanaka, I. Kurachi, Y. Arai

TL;DR
This paper reports the development and testing of a neutron imaging sensor using INTPIX4-SOI silicon devices, demonstrating its detection efficiency and spatial resolution capabilities for neutron imaging applications.
Contribution
It introduces a novel neutron imaging sensor based on INTPIX4-SOI technology and evaluates its performance through irradiation tests at multiple facilities.
Findings
Detection efficiency of ~1.5% for thermal neutrons
Spatial resolution upper bound of 4.1 ± 0.2 μm
Sensor response characterized across various neutron sources
Abstract
We have developed a neutron imaging sensor based on an INTPIX4-SOI pixelated silicon device. Neutron irradiation tests are performed at several neutron facilities to investigate sensor's responses for neutrons. Detection efficiency is measured to be around \% for thermal neutrons. Upper bound of spatial resolution is evaluated to be m in terms of a standard deviation of the line spread function.
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