Optimal Non-Adaptive Probabilistic Group Testing in General Sparsity Regimes
Wei Heng Bay, Eric Price, and Jonathan Scarlett

TL;DR
This paper determines the minimal number of tests needed for noiseless non-adaptive probabilistic group testing across all sparsity regimes, extending previous results and establishing optimality of individual testing in dense regimes.
Contribution
It provides a unified asymptotic characterization of the minimal tests required for all sparsity levels, improving upon prior bounds and removing restrictive assumptions.
Findings
Minimal tests scale as C_{k,n} k \u2206 n, matching n in dense regimes.
Algorithmic analysis based on a slight modification of the Definite Defectives algorithm.
Demonstrates individual testing is optimal in very dense regimes for any non-zero success probability.
Abstract
In this paper, we consider the problem of noiseless non-adaptive probabilistic group testing, in which the goal is high-probability recovery of the defective set. We show that in the case of items among which are defective, the smallest possible number of tests equals up to lower-order asymptotic terms, where is a uniformly bounded constant (varying depending on the scaling of with respect to ) with a simple explicit expression. The algorithmic upper bound follows from a minor adaptation of an existing analysis of the Definite Defectives (DD) algorithm, and the algorithm-independent lower bound builds on existing works for the regimes and . In sufficiently sparse regimes (including ), our main result generalizes that of Coja-Oghlan {\em et al.} (2020) by…
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