Determining the refractive index, absolute thickness and local slope of a thin transparent film using multi-wavelength and multi-incident-angle interference

TL;DR

This paper introduces a rapid interferometric technique utilizing multiple wavelengths and incident angles to accurately measure the thickness, tilt, and refractive index of fluctuating transparent films, applicable in biological and industrial contexts.

Contribution

The paper presents a novel high-speed interferometric method that combines multi-wavelength and multi-angle measurements for detailed characterization of transparent films.

Findings

Effective measurement of film thickness, tilt, and refractive index.

Suitable for dynamic and fluctuating transparent films.

Applicable in biological, fluid, and industrial applications.

Abstract

We describe a high-speed interferometric method, using multiple angles of incidence and multiple wavelengths, to measure the absolute thickness, tilt, the local angle between the surfaces, and the refractive index of a fluctuating transparent wedge. The method is well suited for biological, fluid and industrial applications.