Depth Selection for Deep ReLU Nets in Feature Extraction and Generalization
Zhi Han, Siquan Yu, Shao-Bo Lin, Ding-Xuan Zhou

TL;DR
This paper investigates how the depth of deep ReLU neural networks influences feature extraction and generalization, providing theoretical insights and empirical validation of the depth-feature relationship.
Contribution
It introduces a theoretical framework for understanding feature-depth correspondence and demonstrates that classical empirical risk minimization on deep nets achieves optimal generalization.
Findings
Depth-parameter trade-off in feature extraction
Optimal generalization via empirical risk minimization
Empirical validation through simulations and seismic prediction
Abstract
Deep learning is recognized to be capable of discovering deep features for representation learning and pattern recognition without requiring elegant feature engineering techniques by taking advantage of human ingenuity and prior knowledge. Thus it has triggered enormous research activities in machine learning and pattern recognition. One of the most important challenge of deep learning is to figure out relations between a feature and the depth of deep neural networks (deep nets for short) to reflect the necessity of depth. Our purpose is to quantify this feature-depth correspondence in feature extraction and generalization. We present the adaptivity of features to depths and vice-verse via showing a depth-parameter trade-off in extracting both single feature and composite features. Based on these results, we prove that implementing the classical empirical risk minimization on deep nets…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsNeural Networks and Applications · Anomaly Detection Techniques and Applications · Domain Adaptation and Few-Shot Learning
