TCM-ICP: Transformation Compatibility Measure for Registering Multiple LIDAR Scans
Aby Thomas, Adarsh Sunilkumar, Shankar Shylesh, Aby Abahai T.,, Subhasree Methirumangalath, Dong Chen, Jiju Peethambaran

TL;DR
This paper introduces TCM-ICP, a novel registration algorithm for multiple LiDAR scans that improves accuracy and robustness over traditional ICP, especially in the presence of outliers, by using a new geometric metric called Transformation Compatibility Measure.
Contribution
The paper proposes TCM-ICP, a new registration method that incorporates a geometric metric to select similar point clouds and employs optimization techniques for improved accuracy.
Findings
Achieves comparable or superior registration accuracy to traditional methods.
Performs well even with outliers in the data.
Validated on four real-world scenes.
Abstract
Rigid registration of multi-view and multi-platform LiDAR scans is a fundamental problem in 3D mapping, robotic navigation, and large-scale urban modeling applications. Data acquisition with LiDAR sensors involves scanning multiple areas from different points of view, thus generating partially overlapping point clouds of the real world scenes. Traditionally, ICP (Iterative Closest Point) algorithm is used to register the acquired point clouds together to form a unique point cloud that captures the scanned real world scene. Conventional ICP faces local minima issues and often needs a coarse initial alignment to converge to the optimum. In this work, we present an algorithm for registering multiple, overlapping LiDAR scans. We introduce a geometric metric called Transformation Compatibility Measure (TCM) which aids in choosing the most similar point clouds for registration in each…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsRobotics and Sensor-Based Localization · Advanced Measurement and Metrology Techniques · Astronomical Observations and Instrumentation
