Modeling of Impact Ionization and Charge Trapping in SuperCDMS HVeV Detectors
F. Ponce, W. Page, P.L. Brink, B. Cabrera, M. Cherry, C. Fink, N., Kurinsky, R. Partridge, M. Pyle, B. Sadoulet, B. Serfass, C. Stanford, S.L., Watkins, S. Yellin, B.A. Young
TL;DR
This paper presents a model and experimental method to measure charge trapping and impact ionization in SuperCDMS HVeV detectors, aiming to improve dark matter search sensitivity.
Contribution
It introduces a new model and measurement procedure for charge trapping and impact ionization in SuperCDMS HVeV detectors, enabling more accurate dark matter detection.
Findings
Quantified charge trapping and impact ionization parameters
Isolated main noise sources in measurements
Enhanced detector modeling for dark matter searches
Abstract
A model for charge trapping and impact ionization, and an experiment to measure these parameters is presented for the SuperCDMS HVeV detector. A procedure to isolate and quantify the main sources of noise (bulk and surface charge leakage) in the measurements is also describe. This sets the stage to precisely measure the charge trapping and impact ionization probabilities in order to incorporate this model into future dark matter searches.
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