Structural defects in MBE-grown CdTe-based heterojunctions for photovoltaic applications
Karolina Wichrowska, Tadeusz Wosinski, Jaroslaw Z. Domagala, Slawomir, Kret, Sergij Chusnutdinow, and Grzegorz Karczewski

TL;DR
This study investigates structural defects in MBE-grown CdTe-based heterojunctions using TEM, DLTS, and X-ray diffractometry, revealing dislocation networks and deep-level traps that impact photovoltaic efficiency.
Contribution
It provides detailed characterization of defects and their electronic states in MBE-grown CdTe heterojunctions, linking structural imperfections to photovoltaic performance.
Findings
Dislocation networks are prevalent at lattice-mismatched interfaces.
Deep-level traps are associated with dislocations and vacancies.
Defects likely reduce carrier lifetime and solar cell efficiency.
Abstract
Structural defects in the p-ZnTe/i-CdTe/n-CdTe single-crystalline heterojunctions designed for photovoltaic applications have been investigated by transmission electron microscopy (TEM) and deep-level transient spectroscopy (DLTS). Lattice parameters and misfit strain in the undoped CdTe absorber layers of the heterojunctions, grown by the molecular-beam epitaxy technique on two different substrates, GaAs and CdTe, have been determined with high-resolution X-ray diffractometry. A dense network of misfit dislocations at the lattice-mismatched CdTe/GaAs and ZnTe/CdTe interfaces and numerous threading dislocations and stacking faults have been shown by the cross-sectional TEM imaging of the heterojunctions. The DLTS measurements revealed five deep-level traps in the heterojunctions grown on the GaAs substrates and only three of them in the heterojunctions grown on CdTe. One of the traps,…
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