Crystallographic Characterization of Black Phosphorene and Its Application in Nanostructures
Yi Ren, Pu Liu, Benliang Zhou, Xiaoying Zhou, Guanghui Zhou

TL;DR
This study provides a detailed crystallographic analysis of black phosphorene nanostructures, discovering new edge geometries and demonstrating how edge states influence electronic transport in nanodevices.
Contribution
It introduces a new slope edge geometry in phosphorene, classifies electronic properties based on edge types, and designs a PNR-based junction showing edge state-dependent conductance.
Findings
Discovery of slope edge geometry in phosphorene.
Edge states significantly affect electron transport in PNR junctions.
Conductance oscillations correlate with edge morphology of phosphorene quantum dots.
Abstract
The central question in the field of 2D materials is how a material behaves when it is patterned at nanometer scale with different edge geometries. Due to the anisotropy inherent in the puckered structure, black phosphorene nanostructures may have more varieties of edge geometries. Here, we present a comprehensive 2D planar crystallographic characterization of phosphorene uniformly by a chiral vector (angle), from which a new type of edge atomic configuration, the slope edge geometry is discovered. The phosphorene nanoribbons (PNRs) with slope edges, like previously noticed zigzag and skewed-armchair PNRs, also own interesting twofold-degenerate edge states. These three marginal directions, together with the skewed-zigzag and armchair directions without edge states, divide a phosphorene into four regions among which the electronic property is different from each other. Further, for a…
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