X-ray optics and beam characterisation using random modulation: Experiments

TL;DR

This paper demonstrates experimental use of random modulation techniques for fast, accurate X-ray wavefront sensing to improve optical component manufacturing and enable online optimization of active optics.

Contribution

It provides the first experimental validation of random modulation-based X-ray wavefront sensing for optical characterization and optimization.

Findings

Successful experimental application for refractive and reflective optics

Enhanced accuracy and speed in X-ray wavefront measurements

Potential for improved manufacturing and active optics control

Abstract

In a previous paper, we reviewed theoretically some of the available processing schemes for X-ray wavefront sensing based on random modulation. We here show experimental applications of the technique for characterising both refractive and reflective optical components. These fast and accurate X-ray at-wavelength metrology methods can assist the manufacture of X-ray optics that transport X-ray beams with minimum amount of wavefront distortion. We also recall how such methods can facilitate online optimization of active optics.