RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems

TL;DR

This paper discusses the interdependent challenges of reliability, security, and quality in nanoelectronic systems, emphasizing novel approaches and tools developed within the RESCUE project for these critical aspects.

Contribution

It presents interdisciplinary research advancements in testing, fault analysis, fault-tolerance, safety validation, and security enhancement for nanoelectronic systems within the RESCUE project.

Findings

Novel test generation approaches for nanoelectronics

Cross-layer fault-tolerance techniques developed

Initial implementation of holistic EDA tools

Abstract

The recent trends for nanoelectronic computing systems include machine-to-machine communication in the era of Internet-of-Things (IoT) and autonomous systems, complex safety-critical applications, extreme miniaturization of implementation technologies and intensive interaction with the physical world. These set tough requirements on mutually dependent extra-functional design aspects. The H2020 MSCA ITN project RESCUE is focused on key challenges for reliability, security and quality, as well as related electronic design automation tools and methodologies. The objectives include both research advancements and cross-sectoral training of a new generation of interdisciplinary researchers. Notable interdisciplinary collaborative research results for the first half-period include novel approaches for test generation, soft-error and transient faults vulnerability analysis, cross-layer fault-tolerance and error-resilience, functional safety validation, reliability assessment and run-time management, HW security enhancement and initial implementation of these into holistic EDA tools.