Evaluating Reliability of SSD-Based I/O Caches in Enterprise Storage Systems

TL;DR

This study thoroughly examines the reliability of SSD-based I/O caches in enterprise storage systems under power failures and high temperatures, revealing workload-dependent failure behaviors and the impact of request parameters.

Contribution

It introduces a physical fault injection platform and provides new insights into how workload parameters influence SSD cache reliability under failure conditions.

Findings

Failure rate increases significantly with smaller request sizes.

Read accesses can also fail during power outages, especially during data promotion.

High temperature faults do not cause data failures in the SSD cache.

Abstract

In this paper, we present a comprehensive analysis investigating the reliability of SSD-based I/O caching architectures used in enterprise storage systems under power failure and high-operating temperature. We explore variety of SSDs from top vendors and investigate the cache reliability in mirrored configuration. To this end, we first develop a physical fault injection and failure detection platform and then investigate the impact of workload dependent parameters on the reliability of I/O cache in the presence of two common failure types in data centers, power outage and high temperature faults. We implement an I/O cache scheme using an open-source I/O cache module in Linux operating system. The experimental results obtained by conducting more than twenty thousand of physical fault injections on the implemented I/O cache with different write policies reveal that the failure rate of the I/O cache is significantly affected by workload dependent parameters. Our results show that unlike workload requests access pattern, the other workload dependent parameters such as request size, Working Set Size (WSS), and sequence of the accesses have considerable impact on the I/O cache failure rate. We observe a significant growth in the failure rate in the workloads by decreasing the size of the requests (by more than 14X). Furthermore, we observe that in addition to writes, the read accesses to the I/O cache are subjected to failure in presence of sudden power outage (the failure mainly occurs during promoting data to the cache). In addition, we observe that I/O cache experiences no data failure upon high temperature faults.