Mapping standing-wave cavity modes with a commercial scanning near-field microscope tip
Francesco Ferri, S\'ebastien Garcia, Mohamed Baghdad, Jakob Reichel,, and Romain Long

TL;DR
This paper presents a method using a commercial SNOM tip to map standing-wave patterns inside a Fabry-Perot cavity with sub-wavelength resolution, enabling precise mode characterization and positioning.
Contribution
The paper introduces a novel approach to map cavity modes with a SNOM tip and demonstrates its application to fiber microcavities for detailed mode analysis.
Findings
Successful mapping of standing-wave patterns with sub-wavelength resolution.
Determination of relative antinode positions at different wavelengths.
Precise positioning of microscope objectives using the SNOM tip as a point source.
Abstract
We describe a method to map the standing-wave pattern inside a Fabry-Perot optical cavity with sub-wavelength resolution by perturbing it with a commercially available scanning near-field optical microscope (SNOM) tip. The method is applied to a fiber Fabry-Perot microcavity. We demonstrate its use to determine the relative position of the antinodes at two different wavelengths. In addition, we use the SNOM tip as a point-like source allowing precise positioning of a microscope objective with respect to the cavity mode.
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Taxonomy
TopicsNear-Field Optical Microscopy · Integrated Circuits and Semiconductor Failure Analysis · Force Microscopy Techniques and Applications
