Usage of Scherrer's formula in X-ray diffraction analysis of size distribution in systems of monocrystalline nanoparticles

TL;DR

This paper reevaluates the application of Scherrer's formula in X-ray diffraction analysis of nanoparticle size distributions, highlighting potential misconceptions and proposing refined understanding for more accurate characterization.

Contribution

It provides a critical reassessment of Scherrer's formula usage in nanoparticle size analysis, offering insights for improved accuracy in X-ray diffraction methods.

Findings

Scherrer's formula may be misapplied in size distribution analysis

Reevaluation suggests adjustments for more precise nanoparticle sizing

Implications for better interpretation of X-ray diffraction data

Abstract

In the supporting information file of the article Controlled Formation and Growth Kinetics of Phase-Pure, Crystalline BiFeO3 Nanoparticles (Crystal Growth & Design 2019), there is a description on how to use Scherrer equation for in situ X-ray diffraction analysis of crystallization processes investigated in the article. That description led to a necessary revaluation on the current understanding of the usage of Scherrer equation for analyzing size distributions, as discussed in this work.