Generalized Scharfetter-Gummel schemes for electro-thermal transport in degenerate semiconductors using the Kelvin formula for the Seebeck coefficient
Markus Kantner

TL;DR
This paper introduces two advanced numerical schemes for simulating electro-thermal transport in degenerate semiconductors, leveraging the Kelvin formula for the Seebeck coefficient to improve accuracy and robustness in device modeling.
Contribution
It develops and compares two generalized Scharfetter-Gummel schemes based on the Kelvin formula, enhancing simulation of thermoelectric effects in degenerate semiconductors.
Findings
The modified thermal voltage scheme outperforms the electric field approach.
Both schemes accurately model self-heating effects in semiconductors.
The Kelvin formula simplifies the heat generation rate expression.
Abstract
Many challenges faced in today's semiconductor devices are related to self-heating phenomena. The optimization of device designs can be assisted by numerical simulations using the non-isothermal drift-diffusion system, where the magnitude of the thermoelectric cross effects is controlled by the Seebeck coefficient. We show that the model equations take a remarkably simple form when assuming the so-called Kelvin formula for the Seebeck coefficient. The corresponding heat generation rate involves exactly the three classically known self-heating effects, namely Joule, recombination and Thomson-Peltier heating, without any further (transient) contributions. Moreover, the thermal driving force in the electrical current density expressions can be entirely absorbed in the diffusion coefficient via a generalized Einstein relation. The efficient numerical simulation relies on an accurate and…
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