A general approach to maximise information density in neutron reflectometry analysis
Andrew R. McCluskey, Thomas Arnold, Joshaniel F. K. Cooper, Tim Snow

TL;DR
This paper introduces a Bayesian evidence-based framework to optimize parameter selection in neutron reflectometry analysis, enhancing information density and reducing model ambiguity in interfacial material studies.
Contribution
It presents a robust, generic method for selecting free parameters based on Bayesian evidence, improving model reliability in reflectometry data analysis.
Findings
Framework successfully identifies optimal parameter sets
Application to phospholipid monolayer demonstrates effectiveness
Encourages routine consideration of model evidence in analysis
Abstract
Neutron and X-ray reflectometry are powerful techniques facilitating the study of the structure of interfacial materials. The analysis of these techniques is ill-posed in nature requiring the application of a model-dependent methods. This can lead to the over- and under- analysis of experimental data, when too many or too few parameters are allowed to vary in the model. In this work, we outline a robust and generic framework for the determination of the set of free parameters that is capable of maximising the in-formation density of the model. This framework involves the determination of the Bayesian evidence for each permutation of free parameters; and is applied to a simple phospholipid monolayer. We believe this framework should become an important component in reflectometry data analysis, and hope others more regularly consider the relative evidence for their analytical models.
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Code & Models
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsHigh-pressure geophysics and materials · Nuclear Physics and Applications · Chemical and Physical Properties of Materials
