Imaging Nanoscale Inhomogeneities and Edge Delamination in As-Grown MoS2 Using Tip-Enhanced Photoluminescence
Alvaro Rodriguez, Tim Verhagen, Martin Kalbac, Jana Vejpravova, Otakar, Frank

TL;DR
This study demonstrates nanoscale imaging of inhomogeneities and edge delamination in as-grown MoS2 using tip-enhanced photoluminescence without pretreatment, revealing defect-related PL behavior and differences from exfoliated flakes.
Contribution
First gap-less TEPL imaging on as-grown MoS2 without plasmonic substrates, providing high-resolution insights into inhomogeneities and delamination.
Findings
Homogeneous layer interiors distinguished from defective edges.
Defects and lack of substrate doping influence PL behavior.
Exfoliated flakes show topography- and contamination-related heterogeneities.
Abstract
Methods for nanoscale material characterization are in ever-increasing demand, especially those that can provide a broader range of information at once. Near-field techniques based on combinations of scanning probe microscopy (SPM) and Raman or photoluminescence (PL) spectroscopy (tip-enhanced Raman spectroscopy [TERS] and/or tip-enhanced photoluminescence [TEPL]) are, thanks to their capabilities and fast development, strong candidates for becoming widespread across the scientific community as SPM and Raman microscopy did only a decade or two ago. Herein, a gap-less TEPL study is performed directly on as-grown MoS2 monolayer samples without any pretreatment or transfer, i.e., without the utilization of plasmonic substrate. Thanks to a mapping resolution as low as a few tens of nanometers, homogeneous layer interiors from defective edge fronts in the grown monolayers can be…
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