Quantum certification and benchmarking
J. Eisert, D. Hangleiter, N. Walk, I. Roth, D. Markham, R. Parekh, U., Chabaud, E. Kashefi
TL;DR
This paper reviews methods for certifying and benchmarking quantum devices, emphasizing the importance of precise characterization for advancing quantum computing, communication, and simulation technologies.
Contribution
It provides a comprehensive overview of existing certification, benchmarking, and tomography techniques and discusses their applications in various quantum technologies.
Findings
Summarizes key quantum certification methods
Highlights applications in quantum computing and communication
Discusses challenges in quantum device characterization
Abstract
Concomitant with the rapid development of quantum technologies, challenging demands arise concerning the certification and characterization of devices. The promises of the field can only be achieved if stringent levels of precision of components can be reached and their functioning guaranteed. This review provides a brief overview of the known characterization methods of certification, benchmarking, and tomographic recovery of quantum states and processes, as well as their applications in quantum computing, simulation, and communication.
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