Direct measurements of the properties of Thick-GEM reflective photocathodes
G.Hamar, M.Baruzzo, C.Chatterjee, P.Ciliberti, S.Dalla Torre,, S.S.Dasgupta, B.Gobbo, M.Gregori, S.Levorato, G.Menon, C.A.Santos,, F.Tessarotto, P.Triloki, D.Varga, Y.X.Zhao
TL;DR
This paper presents direct measurements of Thick-GEM reflective photocathodes using a high-resolution optical system, confirming previous indirect findings and addressing key questions for their application in gaseous photon detectors.
Contribution
It introduces a systematic method for directly measuring Thick GEM properties, providing new insights into their suitability as photocathode substrates.
Findings
Confirmed Thick GEM properties through direct observation
Provided detailed surface characterization of Thick GEMs
Supported their use in gaseous photon detectors
Abstract
In the context of the development of novel Thick GEM based detectors of single photons, the high resolution optical system, nicknamed Leopard, providing a detailed surface scanning of the Thick GEM electron multipliers, has been used for a set of systematic measurements of key Thick GEM properties. These results are reported and discussed. They confirm by direct observation Thick GEM properties previously inferred by indirect measurements and answer to relevant questions related to the use of Thick GEMs as photocathode substrates in novel gaseous photon detectors.
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.