Upper Limit Transverse Voltage Calculations from the Glazman Model
M.E. Broussard, P.R. Broussard

TL;DR
This paper refines the understanding of the upper current limit for transverse voltage in thin niobium films by solving vortex-antivortex interaction equations, revealing a temperature-dependent increase contrary to previous models and experiments.
Contribution
It provides a detailed numerical analysis using the complete vortex equations, challenging prior assumptions of temperature independence in Glazman's model.
Findings
Upper current limit increases with temperature in the complete model.
Discrepancy between Glazman's predictions and numerical results.
Comparison with experimental data discussed.
Abstract
The model of Transverse Voltage proposed by L.I. Glazman made predictions on the upper current limit for the existence of Transverse Voltage. In his paper, the upper limit for current at which Transverse Voltage would appear in wide films is temperature independent. Using a Runge-Kutta algorithim and the complete equations for vortex-antivortex interactions, the upper limit for thin niobium films were calculated for several temperatures, and how these compare to Glazman's model and experimental results on the same films are discussed. We find in contrast to both the experimental results and Glazman's prediction, the solution to the complete equations show an increase in the upper current limit as temperature increases.
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Taxonomy
TopicsFluid Dynamics and Thin Films · Advancements in Semiconductor Devices and Circuit Design · Theoretical and Computational Physics
