CMOS Platform for Atomic-Scale Device Fabrication
Tomas Skeren, Nikola Pascher, Arnaud Garnier, Patrick Reynaud,, Emmanuel Rolland, Aurelie Thuaire, Daniel Widmer, Xavier Jehl, Andreas Fuhrer

TL;DR
This paper presents a CMOS-compatible platform for atomic-scale device fabrication that simplifies the process, reduces fabrication time, and enables integration of STM-patterned dopant devices into complex architectures, demonstrated through Si:P nanowires.
Contribution
It introduces a novel CMOS-compatible process flow for atomic-scale device fabrication using STM patterning on silicon on insulator substrates.
Findings
Successful fabrication of degenerately doped Si:P nanowires.
Room temperature magnetotransport measurements confirm device functionality.
Reduced process complexity and fabrication time.
Abstract
Controlled atomic scale fabrication of functional devices is one of the holy grails of nanotechnology. The most promising class of techniques that enable deterministic nanodevice fabrication are based on scanning probe patterning or surface assembly. However, this typically involves a complex process flow, stringent requirements for an ultra high vacuum environment, long fabrication times and, consequently, limited throughput and device yield. Here, a device platform is developed that overcomes these limitations by integrating scanning probe based dopant device fabrication with a CMOS-compatible process flow. Silicon on insulator substrates are used featuring a reconstructed Si(001):H surface that is protected by a capping chip and has pre-implanted contacts ready for scanning tunneling microscope (STM) patterning. Processing in ultra-high vacuum is thus reduced to only a few critical…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
