Probabilistic Modeling of Deep Features for Out-of-Distribution and Adversarial Detection
Nilesh A. Ahuja, Ibrahima Ndiour, Trushant Kalyanpur, Omesh Tickoo

TL;DR
This paper introduces a probabilistic approach to detect out-of-distribution and adversarial samples in deep neural networks by modeling deep features with parametric distributions, significantly improving detection accuracy across image and video data.
Contribution
The paper proposes a novel method using Gaussian and Gaussian mixture models to analyze deep features for OOD and adversarial detection, demonstrating its effectiveness on multiple datasets and architectures.
Findings
Improved detection of OOD and adversarial samples by up to 12 percentage points in AUPR and AUROC.
Effective application to both image and video data, including state-of-the-art adversarial attacks.
First methodology reported for reliably detecting white-box adversarial framing in video classifiers.
Abstract
We present a principled approach for detecting out-of-distribution (OOD) and adversarial samples in deep neural networks. Our approach consists in modeling the outputs of the various layers (deep features) with parametric probability distributions once training is completed. At inference, the likelihoods of the deep features w.r.t the previously learnt distributions are calculated and used to derive uncertainty estimates that can discriminate in-distribution samples from OOD samples. We explore the use of two classes of multivariate distributions for modeling the deep features - Gaussian and Gaussian mixture - and study the trade-off between accuracy and computational complexity. We demonstrate benefits of our approach on image features by detecting OOD images and adversarially-generated images, using popular DNN architectures on MNIST and CIFAR10 datasets. We show that more precise…
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Taxonomy
TopicsAdversarial Robustness in Machine Learning · Anomaly Detection Techniques and Applications · Generative Adversarial Networks and Image Synthesis
