Extreme Value Based Estimation of Critical Single Event Failure Probability

TL;DR

This paper introduces a novel survival probability function for integrated circuits under space ion impact, utilizing extreme value statistics to better estimate the likelihood of critical single event failures.

Contribution

It presents a new approach based on extreme value theory for estimating IC failure probabilities, differing from traditional methods.

Findings

Provides a survival probability model using extreme value statistics.

Enhances accuracy in predicting critical single event failures.

Offers a new framework for space ion impact analysis.

Abstract

A new survival probability function of ICs under space ion impact is proposed. Unlike the conventional approach, the function is based on the extreme value statistics which is rele-vant to the critical single event effects.