Gate-tunable spin exclusive or operation in a silicon-based spin device at room temperature
R. Ishihara, Y. Ando, S. Lee, M. Goto, S. Miwa, Y. Suzuki, H. Koike, and M. Shiraishi (Kyoto Univ., Osaka Univ. & TDK Co.)

TL;DR
This paper demonstrates room temperature operation of a silicon-based spin XOR gate with reconfigurable logic, showing high charge current detection and gate voltage modulation, advancing spintronic logic device technology.
Contribution
The work introduces a silicon-based spin XOR gate operable at room temperature with high charge current detection and reconfigurable logic capabilities.
Findings
Achieved the highest charge current of 0.94 nA in spin XOR gates.
Demonstrated gate voltage modulation enabling multiple device operation.
Validated the XOR behavior with a spin drift-diffusion model.
Abstract
Room temperature operation of a spin exclusive or (XOR) gate was demonstrated in lateral spin valve devices with nondegenerate silicon (Si) channels. The spin XOR gate is a fundamental part of the magnetic logic gate (MLG) that enables reconfigurable and nonvolatile NAND or OR operation in one device. The device for the spin XOR gate consists of three iron (Fe)/cobalt (Co)/magnesium oxide (MgO) electrodes, i.e., two input and one output electrodes. Spins are injected into the Si channel from the input electrodes whose spin angular momentum corresponds to the binary input 1 or 0. The spin drift effect is controlled by a lateral electric field in the Si channel to adjust the spin accumulation voltages under two different parallel configurations, corresponding to (1, 1) and (0, 0), so that they exhibit the same value. As a result, the spin accumulation voltage detected by the output…
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