Monolayer MoS2 field effect transistor with low Schottky barrier height with ferromagnetic metal contacts
Sachin Gupta (1), F. Rortais (1), R. Ohshima (1), Y. Ando (1), T. Endo, (2), Y. Miyata (2), M. Shiraishi (1) (1. Kyoto Univ., (2) Tokyo, Metropolitan Univ.)

TL;DR
This paper demonstrates that ferromagnetic metal contacts on monolayer MoS2 can achieve extremely low Schottky barrier heights, enabling ohmic contact behavior crucial for high-performance spintronic devices.
Contribution
It reports the lowest Schottky barrier height for ferromagnetic Py/MoS2 contacts and shows gate-tunable contact properties, advancing MoS2-based spintronics.
Findings
Schottky barrier height as low as +28.8 meV at zero bias
Gate voltage reduces SBH to -6.8 meV, indicating ohmic contact behavior
Direct growth of MoS2 enables controlled contact properties
Abstract
Two-dimensional MoS2 has emerged as promising material for nanoelectronics and spintronics due to its exotic properties. However, high contact resistance at metal semiconductor MoS2 interface still remains an open issue. Here, we report electronic properties of field effect transistor devices using monolayer MoS2 channels and permalloy (Py) as ferromagnetic (FM) metal contacts. Monolayer MoS2 channels were directly grown on SiO2/Si substrate via chemical vapor deposition technique. The increase in current with back gate voltage shows the tunability of FET characteristics. The Schottky barrier height (SBH) estimated for Py/MoS2 contacts is found to be +28.8 meV (zero-bias), which is the smallest value reported so-far for any direct metal (magnetic or non-magnetic)/monolayer MoS2 contact. With the application of gate voltage (+10 V), SBH shows a drastic reduction down to a value of -6.8…
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