Photometric precision of a Si:As impurity band conduction mid-infrared detector and application to transit spectroscopy
Taro Matsuo, Thomas P. Greene, Roy R. Johnson, Robert E. Mcmurray,, Thomas L. Roellig, Kimberly Ennico

TL;DR
This study evaluates the photometric precision of a mid-infrared Si:As detector for transit spectroscopy, demonstrating potential for high-precision exoplanet observations with JWST, and identifies key noise sources affecting performance.
Contribution
It provides the first detailed measurement of intrinsic photometric stability of a Si:As mid-infrared detector for transit spectroscopy applications.
Findings
Photometric precision limited to 26.3ppm due to gain variation.
Correction for gain drift improved precision to 12.8ppm.
Expected spectro-photometric precision could reach 7ppm with optimized system.
Abstract
Transit spectroscopy is the most promising path toward characterizing nearby terrestrial planets at mid-infrared wavelengths in the next 20 years. The Spitzer Space telescope has achieved moderately good mid-infrared photometric precision in observations of transiting planets, but the intrinsic photometric stability of mid-IR detectors themselves has not been reported in the scientific or technical literature. Here, we evaluated the photometric precision of a JWST MIRI prototype mid-infrared Si:As impurity band conduction detector, using time-series data taken under flood illumination. These measurements of photometric precision were conducted over periods of 10 hours, representative of the time required to observe an exoplanet transit. After selecting multiple sub-regions with a size of 10x10 pixels and compensating for a gain change caused by our warm detector control electronics for…
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