Measuring Patent Claim Generation by Span Relevancy
Jieh-Sheng Lee, Jieh Hsiang

TL;DR
This paper introduces a span-based framework using pre-trained language models to quantitatively measure the relevancy of patent claim spans, aiming to improve patent claim generation quality.
Contribution
It proposes a novel span relevancy metric and a classification approach leveraging BERT and GPT-2 models for patent claim evaluation.
Findings
Span relevancy ratio decreases with higher diversity in GPT-2 generated claims.
Fine-tuned BERT effectively measures span relevancy in patent claims.
The proposed metric validates the quality of patent claim generation.
Abstract
Our goal of patent claim generation is to realize "augmented inventing" for inventors by leveraging latest Deep Learning techniques. We envision the possibility of building an "auto-complete" function for inventors to conceive better inventions in the era of artificial intelligence. In order to generate patent claims with good quality, a fundamental question is how to measure it. We tackle the problem from a perspective of claim span relevancy. Patent claim language was rarely explored in the NLP field. It is unique in its own way and contains rich explicit and implicit human annotations. In this work, we propose a span-based approach and a generic framework to measure patent claim generation quantitatively. In order to study the effectiveness of patent claim generation, we define a metric to measure whether two consecutive spans in a generated patent claims are relevant. We treat such…
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Taxonomy
TopicsTopic Modeling · Intellectual Property and Patents · Biomedical Text Mining and Ontologies
MethodsLinear Layer · Cosine Annealing · Residual Connection · Attention Dropout · Linear Warmup With Linear Decay · Linear Warmup With Cosine Annealing · Discriminative Fine-Tuning · Byte Pair Encoding · Refunds@Expedia|||How do I get a full refund from Expedia? · Dense Connections
