Chance-Constrained and Yield-aware Optimization of Photonic ICs with Non-Gaussian Correlated Process Variations

TL;DR

This paper introduces a data-efficient, yield-aware optimization framework for photonic integrated circuits that significantly reduces simulation costs while handling non-Gaussian correlated process variations.

Contribution

It proposes a novel deterministic approach for yield optimization that requires fewer simulations and effectively manages non-Gaussian correlated variations.

Findings

Achieves over 30x reduction in simulation cost.

Provides more accurate and robust design performance.

Validated on synthetic and real photonic ICs.

Abstract

Uncertainty quantification has become an efficient tool for uncertainty-aware prediction, but its power in yield-aware optimization has not been well explored from either theoretical or application perspectives. Yield optimization is a much more challenging task. On one side, optimizing the generally non-convex probability measure of performance metrics is difficult. On the other side, evaluating the probability measure in each optimization iteration requires massive simulation data, especially when the process variations are non-Gaussian correlated. This paper proposes a data-efficient framework for the yield-aware optimization of photonic ICs. This framework optimizes the design performance with a yield guarantee, and it consists of two modules: a modeling module that builds stochastic surrogate models for design objectives and chance constraints with a few simulation samples, and a novel yield optimization module that handles probabilistic objectives and chance constraints in an efficient deterministic way. This deterministic treatment avoids repeatedly evaluating probability measures at each iteration, thus it only requires a few simulations in the whole optimization flow. We validate the accuracy and efficiency of the whole framework by a synthetic example and two photonic ICs. Our optimization method can achieve more than $30\times$ reduction of simulation cost and better design performance on the test cases compared with a Bayesian yield optimization approach developed recently.