# Optimal X-ray filters for EDXRF analysis

## TL;DR

This paper introduces a semi-analytical method and software tool for determining optimal X-ray filters in EDXRF analysis, improving detection accuracy for trace elements in complex samples.

## Contribution

It presents a novel semi-analytical approach and the xfilter program to optimize beam filtering parameters for EDXRF measurements across various conditions.

## Key findings

- xfilter accurately predicts optimal filters for EDXRF
- Excellent agreement between calculations and experimental measurements
- Method improves detection sensitivity for trace elements

## Abstract

This work presents a semi-analytical approach to answer the question of optimal beam filtering in the case of EDXRF measurements with an X-ray tube. A collection of programs, called xfilter, is presented that is capable to find the optimal filter material, the optimal filter thickness, and the optimal scattering angle, for all possible combinations of trace elements, target materials, and tube voltages. The concepts of the calculations are introduced in a general manner and demonstrated with a specific example, the detection of gold K_alpha1 XRF within human tissue. Comparing the calculation results and an EDXRF measurement shows excellent agreement.