# Safe Feature Elimination for Non-Negativity Constrained Convex Optimization

## TL;DR

This paper introduces a safe feature elimination method for non-negativity constrained convex optimization, enabling the removal of guaranteed zero features using primal-dual feasible pairs, improving efficiency and robustness especially in ill-conditioned problems.

## Contribution

The paper develops a novel safe feature elimination strategy for non-negativity constrained convex problems, utilizing primal-dual feasible pairs to enhance robustness and applicability.

## Key findings

- Successfully eliminates zero features in ill-conditioned problems
- Certifies the uniqueness of non-negative least-squares solutions
- Demonstrates effectiveness on synthetic and microscopy datasets

## Abstract

Inspired by recent work on safe feature elimination for $1$-norm regularized least-squares, we develop strategies to eliminate features from convex optimization problems with non-negativity constraints. Our strategy is safe in the sense that it will only remove features/coordinates from the problem when they are guaranteed to be zero at a solution. To perform feature elimination we use an accurate, but not optimal, primal-dual feasible pair, making our methods robust and able to be used on ill-conditioned problems. We supplement our feature elimination problem with a method to construct an accurate dual feasible point from an accurate primal feasible point; this allows us to use a first-order method to find an accurate primal feasible point, then use that point to construct an accurate dual feasible point and perform feature elimination. Under reasonable conditions, our feature elimination strategy will eventually eliminate all zero features from the problem. As an application of our methods we show how safe feature elimination can be used to robustly certify the uniqueness of non-negative least-squares (NNLS) problems. We give numerical examples on a well-conditioned synthetic NNLS problem and a on set of 40000 extremely ill-conditioned NNLS problems arising in a microscopy application.