# On Calibration of a Nominal Structure-Property Relationship Model for Chiral Sculptured Thin Films by Axial Transmittance Measurements

## TL;DR

This paper investigates calibrating a structure-property model for chiral sculptured thin films using axial transmittance measurements, demonstrating that non-axial measurements can resolve calibration ambiguities.

## Contribution

It introduces a calibration approach for the model and shows how non-axial transmittance data improve accuracy.

## Key findings

- Calibration ambiguity can be resolved with non-axial measurements
- Model fitting aligns well with measured transmittance spectra
- Axial transmittance alone may be insufficient for accurate calibration

## Abstract

A chiral sculptured thin film is fabricated from patinal titanium oxide using the serial bideposition technique. Axial transmittance spectrums are measured over a spectral region encompassing the Bragg regime for axial excitation. The same spectrums are calculated using a nominal structure-property relationship model and the parameter space of the model is explored for best fits of the calculated and measured transmittances. Ambiguity arising on calibrating the model against axial transmittance measurements is shown to be resolvable using non--axial transmittance measurements.