Application of Doppler Broadened Gamma Spectroscopy to Study the Surface of Graphene
A. H. Weiss, V. A. Chirayath, R. W. Gladen, A. J. Fairchild, M. D., Chrysler, P. A. Sterne, and A. R. Koymen

TL;DR
This study demonstrates that Doppler broadened gamma spectroscopy with a variable energy positron beam can provide surface-sensitive chemical information about graphene layers on copper, aligning experimental results with theoretical models.
Contribution
The paper introduces a novel application of Doppler broadened gamma spectroscopy using an advanced positron beam to analyze the surface layers of graphene with depth resolution.
Findings
Qualitative agreement between measured and calculated spectra.
Evidence that 2 eV spectra relate to graphene surface layers.
High momentum tail analysis reveals surface chemical sensitivity.
Abstract
We present Doppler broadened gamma spectra, obtained using the newly developed advanced positron beam at the University of Texas at Arlington, from a sample consisting of 6 to 8 layers of graphene (MLG) on polycrystalline Cu. The kinetic energy of the positron beam was varied form 2 eV to 20 keV allowing for a depth resolved measurement. The ratio curves formed by dividing the measured Doppler broadened gamma spectra obtained at low positron kinetic energies (~2eV) to the gamma spectra obtained at 20 keV were compared to ratio curves found by dividing the calculated spectra of bulk graphite to bulk Cu. The ratio curves obtained from the measured results show qualitative agreement with those obtained from the calculated spectra. In particular, both sets of curves indicate a much reduced intensity at high momentum. The agreement between the measured and calculated curves is consistent…
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