# Mitigating the effects of charged particle strikes on TES arrays for exotic atom X-ray experiments

## TL;DR

This paper presents analysis techniques to mitigate charged particle effects on TES arrays in exotic atom experiments, significantly improving energy resolution by reducing pulse pileup and thermal crosstalk.

## Contribution

Developed novel analysis methods to assess and reduce charged particle event impacts on TES array measurements in high-energy environments.

## Key findings

- Elimination of pileup components in X-ray peaks.
- Improved energy resolution from 6.6 eV to 5.7 eV at 6.9 keV.
- Effective reduction of thermal crosstalk effects.

## Abstract

Exotic atom experiments place transition-edge-sensor (TES) microcalorimeter arrays in a high-energy charged particle rich environment. When a high-energy charged particle passes through the silicon substrate of a TES array, a large amount of energy is deposited and small pulses are generated across multiple pixels in the TES array due to thermal crosstalk. We have developed analysis techniques to assess and reduce the effects of charged particle events on exotic atom X-ray measurements. Using this technique, the high-energy and low-energy components of the X-ray peaks due to pileup are eliminated, improving the energy resolution from 6.6 eV to 5.7 eV at 6.9 keV.