# Applicability of the Debye-Waller damping factor for the determination of the line-edge roughness of lamellar gratings

## TL;DR

This paper evaluates the use of the Debye-Waller damping factor for measuring line-edge roughness in lamellar gratings, analyzing its applicability based on roughness distribution and diffraction data.

## Contribution

It systematically investigates the conditions under which the Debye-Waller factor can accurately determine line-edge roughness in nanostructures.

## Key findings

- Two limits for applying the DWF depending on roughness distribution
- The DWF's effectiveness varies with the statistical nature of roughness
- Guidelines for using DWF in nanostructure roughness analysis

## Abstract

Periodic nanostructures are fundamental elements in optical instrumentation as well as basis structures in integrated electronic circuits. Decreasing sizes and increasing complexity of nanostructures have made roughness a limiting parameter to the performance. Grazing-incidence small-angle X-ray scattering is a characterization method that is sensitive to three-dimensional structures and their imperfections. To quantify line-edge roughness, a Debye-Waller factor (DWF), which is derived for binary gratings, is usually used. In this work, we systematically analyze the effect of roughness on the diffracted intensities. Two different limits to applying the DWF are found depending on whether or not the roughness is normally distributed.