Coherence properties of the high-energy fourth-generation X-ray synchrotron sources

TL;DR

This paper analyzes the coherence properties of fourth-generation high-energy X-ray synchrotron sources, demonstrating their potential to reach diffraction limits at certain energies and the impact of energy spread on coherence.

Contribution

It provides a detailed analysis of coherence limits and the effects of energy spread in low-emittance storage rings for high-energy X-ray generation.

Findings

Diffraction limit at rac12 of wavelength for soft X-rays.

Approximately ten modes contribute at 12 keV energy.

Increasing energy spread decreases the degree of coherence.

Abstract

We performed an analysis of coherence properties of the 4-th generation high-energy storage rings with emittance values of 10 pmrad. It is presently expected that a storage ring with these low emittance values will reach diffraction limit at hard X-rays. Simulations of coherence properties were performed with the XRT software and analytical approach for different photon energies from 500 eV to 50 keV. It was demonstrated that a minimum photon emittance (diffraction limit) reached at such storage rings is {\lambda}/2{\pi}. Using mode decomposition we showed that at the parameters of the storage ring considered in this work, diffraction limit will be reached for soft X-ray energies of 500 eV. About ten modes will contribute to the radiation field at 12 keV photon energy and even more modes give a contribution at higher photon energies. Energy spread effects of the electron beam in a low emittance storage ring were analysed in detail. Simulations were performed at different relative energy spread values from zero to 0.2%. We observed a decrease of the degree of coherence with an increase of the relative energy spread value. Our analysis shows that to reach diffraction limit for high photon energies electron beam emittance should go down to 1 pmrad and below.