Field emission: Why converting LAFE voltages to macroscopic fields before making a Fowler-Nordheim plot has often led to spurious characterization results
Richard G. Forbes

TL;DR
This paper highlights that converting voltages to macroscopic fields before Fowler-Nordheim analysis often causes false characterization results in large-area field emitters, advocating for raw data use and orthodoxy testing.
Contribution
It identifies the defective pre-conversion equation as the cause of spurious FEF values and recommends analyzing raw data with orthodoxy tests for more reliable characterization.
Findings
Approximately 40% of published FN plots had spuriously high FEF values.
Pre-conversion equations may be incompatible with circuit theory for non-ideal devices.
Using raw data and orthodoxy tests improves the reliability of LAFE characterization.
Abstract
An important parameter used to characterize large-area field electron emitters (LAFEs) is the characteristic apex field enhancement factor {\gamma}_C. This parameter is normally extracted from the slope of a Fowler-Nordheim (FN) plot. Several years ago, the development of an "orthodoxy test" allowed a sample of 19 published FN plots relating to LAFEs to be tested, and it was found that about 40% of the related papers were reporting spuriously high values for {\gamma}_C. In technological papers relating to LAFE characterization, common practice is to pre-convert the measured voltage into an (apparent) value of macroscopic field before making and analyzing a FN plot. This paper suggests that the cause of the "spurious-FEF-value" problem is the widespread use of a pre-conversion equation that is defective (for example, not compatible with ordinary electrical circuit theory) when it is…
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Taxonomy
TopicsSemiconductor materials and devices · Diamond and Carbon-based Materials Research · Electronic and Structural Properties of Oxides
