Local Asymptotic Equivalence of the Bai and Ng (2004) and Moon and Perron (2004) Frameworks for Panel Unit Root Testing
Oliver Wichert, I. Gaia Becheri, Feike C. Drost, Ramon van den Akker

TL;DR
This paper demonstrates that two major frameworks for panel unit root testing are asymptotically equivalent under Gaussian innovations, and introduces an optimal test that performs well regardless of heterogeneity in the data.
Contribution
It shows the asymptotic equivalence of Bai and Ng (2004) and Moon and Perron (2004) frameworks and develops a new, uniformly most powerful test for panel unit root testing.
Findings
Both frameworks are LAN with the same central sequence.
Existing tests only optimal under no heterogeneity.
New test outperforms existing tests with heterogeneity.
Abstract
This paper considers unit-root tests in large n and large T heterogeneous panels with cross-sectional dependence generated by unobserved factors. We reconsider the two prevalent approaches in the literature, that of Moon and Perron (2004) and the PANIC setup proposed in Bai and Ng (2004). While these have been considered as completely different setups, we show that, in case of Gaussian innovations, the frameworks are asymptotically equivalent in the sense that both experiments are locally asymptotically normal (LAN) with the same central sequence. Using Le Cam's theory of statistical experiments we determine the local asymptotic power envelope and derive an optimal test jointly in both setups. We show that the popular Moon and Perron (2004) and Bai and Ng (2010) tests only attain the power envelope in case there is no heterogeneity in the long-run variance of the idiosyncratic…
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