Atomic-scale manipulation and in situ characterization with scanning tunneling microscopy
Wonhee Ko, Chuanxu Ma, Giang D. Nguyen, Marek Kolmer, and An-Ping Li

TL;DR
This paper reviews recent advances in atomic-scale manipulation and in situ characterization using scanning tunneling microscopy, highlighting progress in quantum property control, multi-probe systems, and automation for scalable quantum device fabrication.
Contribution
It introduces novel multi-probe STM techniques and automation strategies that enhance atomic manipulation and in situ characterization capabilities.
Findings
Multi-probe STM extends in situ characterization to charge and spin transport.
Automation and integration with lithography enable scalable quantum structure fabrication.
Precise atomic control addresses quantum properties in relevant materials.
Abstract
Scanning tunneling microscope (STM) has presented a revolutionary methodology to the nanoscience and nanotechnology. It enables imaging the topography of surfaces, mapping the distribution of electronic density of states, and manipulating individual atoms and molecules, all at the atomic resolution. In particular, the atom manipulation capability has evolved from fabricating individual nanostructures towards the scalable production of the atomic-sized devices bottom-up. The combination of precision synthesis and in situ characterization of the atomically precise structures has enabled direct visualization of many quantum phenomena and fast proof-of-principle testing of quantum device functions with real-time feedback to guide the improved synthesis. In this article, several representative examples are reviewed to demonstrate the recent development of atomic scale manipulation.…
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