An Algebraic Approach to Fast Estimation of the Threshold Voltage of Junctionless Double Gate MOSFETs Using the Gram Schmidt Method
Mohsen Annabestani, Mahshid Nasserian, Fatemeh Hasanzadeh, Mohammad, Taherzadeh-Sani, Alireza Hassanzadeh

TL;DR
This paper introduces a novel algebraic method using Gram-Schmidt orthogonalization to rapidly and accurately estimate the threshold voltage of Junctionless Double-Gate MOSFETs, significantly speeding up circuit simulations.
Contribution
It proposes a new nonlinear autoregressive model with Gram-Schmidt orthogonalization for fast, precise threshold voltage estimation in JL-DG-MOSFETs, outperforming existing analytical models in speed.
Findings
The proposed model is 313 times faster than current analytical models.
The average normalized mean square error of the model is 0.435%.
The method provides high-precision threshold voltage estimation for circuit design.
Abstract
The effect of decreasing Drain-Induced Barrier Lowering (DIBL) is one of the non-desirable short-channel effects in the MOSFETs family, which causes the threshold voltage of the transistor to be reduced by increasing the voltage of the drain. This effect makes it impossible for circuit designers to consider VT as a constant value, and hence, it is necessary to calculate VT as a function of the drain voltage. Therefore, to consider the effect of DIBL in the design of integrated circuits, a large computational burden is imposed on the system, which slows down the simulation process in circuit-level simulators, particularly when a large number of transistors are to be simulated. Accordingly, in this paper, a multiple input single output (MISO) Nonlinear Autoregressive (N-AR) model using the Gram-Schmidt orthogonalization approach is proposed, that calculates the threshold voltage of the…
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Taxonomy
TopicsAdvancements in Semiconductor Devices and Circuit Design · Semiconductor materials and devices · Silicon Carbide Semiconductor Technologies
