# Laser source for dimensional metrology: investigation of an iodine stabilized system based on narrow linewidth 633 nm DBR diode

## TL;DR

This paper presents an iodine stabilized DBR diode laser at 633 nm as a promising alternative to He-Ne lasers for dimensional metrology, offering enhanced stability, tunability, power, and modulation capabilities.

## Contribution

It introduces a novel iodine stabilized DBR diode laser system as a practical, high-performance laser source for scientific and industrial dimensional metrology applications.

## Key findings

- Laser system shows comparable stability to He-Ne lasers.
- Offers wider tuning range and higher output power.
- Suitable for advanced interferometric measurement techniques.

## Abstract

We demonstrated that an iodine stabilized Distributed Bragg Reflector (DBR) diode based laser system lasing at a wavelength in close proximity to $\lambda = 633\,$nm could be used as an alternative laser source to the He-Ne lasers in both scientific and industrial metrology. This yields additional advantages besides the optical frequency stability and coherence: inherent traceability, wider optical frequency tuning range, higher output power and high frequency modulation capability. We experimentally investigated the characteristics of the laser source in two major steps: first using a wavelength meter referenced to a frequency comb controlled with a hydrogen maser and then on a interferometric optical bench testbed where we compared the performance of the laser system with that of a traditional frequency stabilized He-Ne laser. The results indicate that DBR diode laser system provides a good laser source for applications in dimensional (nano)metrology, especially in conjunction with novel interferometric detection methods exploiting high frequency modulation or multiaxis measurement systems.