# Design for a 10 KeV Multi-Pass Transmission Electron Microscope

## TL;DR

This paper presents the design of a 10 keV multi-pass transmission electron microscope (MPTEM) that aims to reduce radiation damage and improve imaging of sensitive samples, with a novel electron mirror system and a theoretical model for resolution.

## Contribution

It introduces a novel 10 keV MPTEM design with fast-switching electron mirrors and develops a contrast transfer function model for multi-pass imaging resolution.

## Key findings

- Design of a 10 keV MPTEM with electron mirrors
- Development of a multi-pass contrast transfer function model
- Potential for reduced radiation damage in cryo-EM

## Abstract

Multi-pass transmission electron microscopy (MPTEM) has been proposed as a way to reduce damage to radiation-sensitive materials. For the field of cryo-electron microscopy (cryo-EM), this would significantly reduce the number of projections needed to create a 3D model and would allow the imaging of lower-contrast, more heterogeneous samples. We have designed a 10 keV proof-of-concept MPTEM. The column features fast-switching gated electron mirrors which cause each electron to interrogate the sample multiple times. A linear approximation for the multi-pass contrast transfer function (CTF) is developed to explain how the resolution depends on the number of passes through the sample.